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Influences of interface and dislocation behavior on microstructure evolution : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A. / editors Mark Aindow ... [y otros.] - 1 volumen (varias paginaciones) : ilustraciones - Materials Research Society symposium proceedings ; v. 652 . - Materials Research Society symposium proceedings .

ISBN: 1558995625

Subjects--Topical Terms:
Metalografía--Congresos
Microestructura--Congresos
Límites de grano--Congresos

LC Class. No.: TN689.2 / I52

Dewey Class. No.: 669/.95