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Tan, Cher Ming, 1959-,

Electromigration in ULSI Interconnections / Cher Ming Tan - xix, 291 páginas : ilustraciones - International series on advances in solid state electronics and technology .

ISBN: 9789814273329 9814273325

Subjects--Topical Terms:
Circuitos integrados--Ultra integración a gran escala
Electrodifusión

LC Class. No.: TK7874.76 / T35