TY  - BOOK
AU  - Tan,Cher Ming
TI  - Electromigration in ULSI Interconnections
T2  - International series on advances in solid state electronics and technology
SN  - 9789814273329
AV  - TK7874.76 T35
PY  - 2010///
CY  - Singapore
PB  - World Scientific
KW  - Circuitos integrados
KW  - Ultra integración a gran escala
KW  - Electrodifusión
ER  -