000 | 00863nam a2200265zi 4500 | ||
---|---|---|---|
003 | $$aOCoLC | ||
005 | 20220221131511.0 | ||
008 | 021105s2001 nyua b 001 0 eng | ||
020 | _a0824703804 (papel alcalino) | ||
035 | _aMX001000937162 | ||
040 |
_aDLC _cDLC _dPMC |
||
041 | _aENG | ||
050 | 0 |
_aTK7871.85 _bC637 |
|
082 | 0 | 0 |
_a621.3815/2 _221 |
245 | 0 | 0 |
_aContamination-free manufacturing for semiconductors and other precision products / _cedited by Robert P. Donovan |
264 | 1 |
_aNew York : _bM. Dekker, _c2001 |
|
300 |
_ax, 448 páginas : _bilustraciones ; |
||
650 | 0 |
_aSemiconductores _xDiseño y construcción |
|
650 | 0 |
_aSemiconductores _xDefectos |
|
700 | 1 |
_aDonovan, Robert P., _eeditor |
|
336 |
_atexto _2rdacontent |
||
337 |
_asin medio _2rdamedia |
||
338 |
_avolumen _2rdacarrier |
||
999 |
_c14252 _d14252 |