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_aTK7870.23 _bA33 |
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_a658.5/7 _221 |
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_aAccelerated stress testing handbook : _bguide for achieving quality products / _cedited by H. Anthony Chan, Paul J. Englert |
264 | 1 |
_aNew York : _bIEEE, _cc2001 |
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300 |
_axxii, 372 páginas : _bilustraciones ; |
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650 | 0 |
_aAparatos e instrumentos electrónicos _xPruebas |
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650 | 0 |
_aAparatos e instrumentos electrónicos _xConfiabilidad |
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650 | 0 | _aPruebas ambientales | |
700 | 1 |
_aChan, H. Anthony, _d1952- , _eeditor |
|
700 | 1 |
_aEnglert, Paul J., _d1960- , _eeditor |
|
336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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_c14958 _d14958 |