000 | 00762nam a2200241zi 4500 | ||
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005 | 20220221131536.0 | ||
008 | 040517s2003 njua 000 0 eng | ||
020 | _a0471439959 (encuadernado en tela) | ||
035 | _aMX001000995464 | ||
040 |
_aDLC _bspa _cDLC _dUNAMX |
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041 | _aENG | ||
050 | 0 | 0 |
_aTK7868.D5 _bM52 2003 |
100 | 1 |
_aMiczo, Alexander, _eautor |
|
245 | 1 | 0 |
_aDigital logic testing and simulation / _cAlexander Miczo |
250 | _a2nd ed. | ||
264 | 1 |
_aHoboken, New Jersey : _bWiley-Interscience, _cc2003 |
|
300 |
_axxii, 668 páginas : _bilustraciones |
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650 | 0 |
_aElectrónica digital _xPruebas |
|
336 |
_atexto _2rdacontent |
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337 |
_asin medio _2rdamedia |
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338 |
_avolumen _2rdacarrier |
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999 |
_c15657 _d15657 |