000 | 00890nam a2200253zi 4500 | ||
---|---|---|---|
005 | 20220221131543.0 | ||
008 | 050216s2004 gw a 000 0 eng | ||
020 | _a3540206620 (papel alcalino) | ||
035 | _aMX001001014424 | ||
040 |
_aDLC _bspa _cDLC _dDLC _dUNAMX |
||
050 | 0 | 0 |
_aTA418.9N35 _bN3455 |
245 | 0 | 0 |
_aNanoscale characterisation of ferroelectric materials : _bscanning probe microscopy approach / _cM. Alexe, A. Gruverman, eds. |
264 | 1 |
_aBerlin : _bSpringer Verlag, _cc2004 |
|
300 |
_axiii, 282 páginas : _bhojas (algunas a color) |
||
490 | 0 | _aNanoscience and technology | |
650 | 0 | _aMateriales nanoestructurados | |
650 | 0 | _aNanotecnologĂa | |
700 | 1 |
_aAlexe, Marin, _eeditor |
|
700 | 1 |
_aGruverman, Alexei, _eeditor |
|
336 |
_atexto _2rdacontent |
||
337 |
_asin medio _2rdamedia |
||
338 |
_avolumen _2rdacarrier |
||
999 |
_c16107 _d16107 |