| 000 | 00857nam^a2200229zi^4500 | ||
|---|---|---|---|
| 008 | 061113s2004^^^^xxua^^^^^^^^^^000^0^eng^^ | ||
| 020 | _a1402077246 | ||
| 035 | _aMX001001083853 | ||
| 040 |
_aUKM _bspa _cUKM _dOHX _dTXA _dPMC _dBAKER _dNLGGC _dUNAMX |
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| 050 | 4 |
_aTK7874 _bT437 |
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| 082 | 1 | 4 |
_a621.381548 _222 |
| 245 | 0 | 0 |
_aTest and design-for-testability in mixed-signal integrated circuits / _cedited by José L. Huertas |
| 264 | 1 |
_aBoston : _bKluwer Academic, _cc2004 |
|
| 300 |
_axiv, 298 páginas : _bilustraciones |
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| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 650 | 0 |
_aCircuitos de señal mixta _xDiseño y construcción |
|
| 650 | 0 |
_aCircuitos integrados _xVerificación |
|
| 650 | 0 |
_aCircuitos de señales mixtas _xPruebas |
|
| 700 | 1 |
_aHuertas, José L. _q(José Luis), _eeditor |
|